[article] 
in COST > N° 10 [01/01/2012] . - p. 119

Titre :	Vulnerability study of embedded circuits to space radiations single event phenomena
Type de document :	texte imprimé
Auteurs :	S. Karoui, Auteur
Année de publication :	2012
Article en page(s) :	p. 119
Langues :	Anglais
Mots-clés :	Space environment  Heavy Ions  Offset  SEP Phenomenon  Functional Testers
Résumé :	The radiation in space environment with can induce failures disturbing the functions ofthe space applications embedded VLSI circuit. None means ofprevention provide a total immunity. A solution it consists in studying and predicting the sensitivity ofcomponents to be used in such applications, with an aim of choosing the least sensitive circuits. The objective of this work is to present a global methodology of heavy ions testing as well as obtained results for various VLSI circuits.

[article] Vulnerability study of embedded circuits to space radiations single event phenomena [texte imprimé] / S. Karoui, Auteur . - 2012 . - p. 119.
Langues : Anglais
in COST > N° 10 [01/01/2012] . - p. 119

Mots-clés :

Space environment  Heavy Ions  Offset  SEP Phenomenon  Functional Testers

Résumé :

The radiation in space environment with can induce failures disturbing the functions ofthe space applications embedded VLSI circuit. None means ofprevention provide a total immunity. A solution it consists in studying and predicting the sensitivity ofcomponents to be used in such applications, with an aim of choosing the least sensitive circuits. The objective of this work is to present a global methodology of heavy ions testing as well as obtained results for various VLSI circuits.