Electron-Phonon Interaction Model and Its Application to Thermal Transport Simulation During Electrostatic Discharge Event in NMOS Transistor / Jae Sik Jin in Journal of Heat Transfer, VOL 131 No9 /2009 ([01/09/2009]) 

Public ISBD [article]  in Journal of Heat Transfer > VOL 131 No9 /2009 [01/09/2009] . - p 092401 Titre : Electron-Phonon Interaction Model and Its Application to Thermal Transport Simulation During Electrostatic Discharge Event in NMOS Transistor Type de document : texte imprimé Auteurs : Jae Sik Jin, Auteur Année de publication : 2009 Article en page(s) : p 092401 Langues : Anglais En ligne : http://heattransfer.asmedigitalcollection.asme.org/article.aspx?articleID=147521 [...] [article] Electron-Phonon Interaction Model and Its Application to Thermal Transport Simulation During Electrostatic Discharge Event in NMOS Transistor [texte imprimé] / Jae Sik Jin, Auteur . - 2009 . - p 092401. Langues : Anglais in Journal of Heat Transfer > VOL 131 No9 /2009 [01/09/2009] . - p 092401 En ligne : http://heattransfer.asmedigitalcollection.asme.org/article.aspx?articleID=147521 [...]

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